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Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2795-2798

MgO insulating films prepared by sol-gel route for SiC substrate

Author keywords

Electrical properties; Films; Insulator; MgO; SiC; Sol gel processing

Indexed keywords

ENERGY GAP; FREQUENCIES; INSULATING MATERIALS; MAGNESIA; MICROSTRUCTURE; MICROWAVES; PERMITTIVITY; SEMICONDUCTING FILMS; SOL-GELS;

EID: 20444455854     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.142     Document Type: Article
Times cited : (16)

References (10)
  • 1
    • 0030268828 scopus 로고    scopus 로고
    • Status of silicon carbide (SiC) as a wide band-gap semiconductor for high-temperature applications: A review
    • J.B. Casady and R.W. Johnson Status of silicon carbide (SiC) as a wide band-gap semiconductor for high-temperature applications: A review Solid State Electron. 39 1996 1409-1422
    • (1996) Solid State Electron. , vol.39 , pp. 1409-1422
    • Casady, J.B.1    Johnson, R.W.2
  • 2
    • 0003195308 scopus 로고    scopus 로고
    • SiC materials and devices
    • Academic Press
    • Y.S. Park SiC materials and devices Semiconductor and Semimetals Vol 52 1998 Academic Press
    • (1998) Semiconductor and Semimetals , vol.52
    • Park, Y.S.1
  • 3
    • 0034833204 scopus 로고    scopus 로고
    • Silica films on silicon carbide: A review of electrical properties and device applications
    • C. Raynaud Silica films on silicon carbide: A review of electrical properties and device applications J. Non-Cryst. Solids 280 2001 1-31
    • (2001) J. Non-Cryst. Solids , vol.280 , pp. 1-31
    • Raynaud, C.1
  • 5
    • 0033096736 scopus 로고    scopus 로고
    • Insulator investigation on SiC for improved reliability
    • L.A. Lipkin and J.W. Palmour Insulator investigation on SiC for improved reliability IEEE Trans. Electron Dev. 46 1999 546-548
    • (1999) IEEE Trans. Electron Dev. , vol.46 , pp. 546-548
    • Lipkin, L.A.1    Palmour, J.W.2
  • 7
    • 17244363632 scopus 로고    scopus 로고
    • Structural characterization of sol-gel derived MgO thin film on Si substrate
    • J.-G. Yoon and Y.J. Kwag Structural characterization of sol-gel derived MgO thin film on Si substrate J. Korean Phys. Soc. 31 1997 613-616
    • (1997) J. Korean Phys. Soc. , vol.31 , pp. 613-616
    • Yoon, J.-G.1    Kwag, Y.J.2
  • 10
    • 0019938876 scopus 로고
    • A.C. electrical breakdown in thin MgO films
    • A. Singh and R. Pratap A.C. electrical breakdown in thin MgO films Thin Solid Films 87 1982 147-150
    • (1982) Thin Solid Films , vol.87 , pp. 147-150
    • Singh, A.1    Pratap, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.