메뉴 건너뛰기




Volumn , Issue , 2008, Pages 550-555

Unraveling the cannot duplicate and retest OK problems by utilizing physics in testing and diagnoses

Author keywords

Cannot duplicate; Diagnoses; Diagnostics; False alarms; Retest OK

Indexed keywords

ALARM SYSTEMS; AUTOMATIC TESTING; DIAMONDS; ERRORS; MAINTENANCE; TESTING;

EID: 57949101916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2008.4662678     Document Type: Conference Paper
Times cited : (9)

References (19)
  • 1
    • 57949114871 scopus 로고    scopus 로고
    • Department of Defense, Testability Program for Electronic Systems and Equipment, MIL-HDBK-2165, 31 July 1995
    • Department of Defense, "Testability Program for Electronic Systems and Equipment", MIL-HDBK-2165, 31 July 1995
  • 2
    • 57949116816 scopus 로고    scopus 로고
    • W. R. Simpson, J. H. Bailey, K. B. Barto, E. Esker, Prediction and Analysis of Testability Attributes: Organizational-Level Testability Prediction, RADC-TR-85-268, Rome Air Development Center, Griffis AFB, N.Y., Feb. 1986
    • W. R. Simpson, J. H. Bailey, K. B. Barto, E. Esker, "Prediction and Analysis of Testability Attributes: Organizational-Level Testability Prediction", RADC-TR-85-268, Rome Air Development Center, Griffis AFB, N.Y., Feb. 1986
  • 3
    • 57949085952 scopus 로고
    • United Kingdom Ministry of Defence Standard 00-13/Issue 3, 17 June
    • United Kingdom Ministry of Defence Standard 00-13/Issue 3, 17 June 1994.
    • (1994)
  • 4
    • 57949089870 scopus 로고    scopus 로고
    • Test Access Port and Boundary-Scan Architecture
    • Institute of Electrical and Electronics Engineers
    • Institute of Electrical and Electronics Engineers "Test Access Port and Boundary-Scan Architecture", Standard 1149.1, IEEE 2001.
    • (2001) Standard 1149.1, IEEE
  • 5
    • 57949094841 scopus 로고    scopus 로고
    • Surface Mount Technology Association, SMTA
    • Surface Mount Technology Association, "SMTA Testability Guidelines 101C," SMTA, 2002.
    • (2002) SMTA Testability Guidelines , vol.101 C
  • 6
    • 48049119908 scopus 로고    scopus 로고
    • Design for Diagnosability Guidelines
    • September
    • L. Y. Ungar, "Design for Diagnosability Guidelines", Proc. AUTOTESTCON 2007, September 2007.
    • (2007) Proc. AUTOTESTCON 2007
    • Ungar, L.Y.1
  • 7
    • 43549115499 scopus 로고    scopus 로고
    • An Economics Model of Supportability through Design for Testability
    • L. Y. Ungar, "An Economics Model of Supportability through Design for Testability", Proc. AUTOTESTCON 2006, 2006.
    • (2006) Proc. AUTOTESTCON 2006
    • Ungar, L.Y.1
  • 8
    • 33847730245 scopus 로고    scopus 로고
    • Knowledge Base to Manage the Grading and Selection of Testability Guidelines
    • L. Y. Ungar, and R. Parameswaran, "Knowledge Base to Manage the Grading and Selection of Testability Guidelines", Proc. AUTOTESTCON 2005, 2005.
    • (2005) Proc. AUTOTESTCON 2005
    • Ungar, L.Y.1    Parameswaran, R.2
  • 9
    • 57949108022 scopus 로고    scopus 로고
    • A.T.E. Solutions, Inc, The Testability Director, Version 3.2, Software, A.T.E. Solutions, Inc. 2003, Online] Available
    • A.T.E. Solutions, Inc., "The Testability Director, Version 3.2", Software, A.T.E. Solutions, Inc. 2003, [Online] Available http://www.ATESolutionsInc.com/OurProducts/TestabilityDirector/
  • 11
    • 43549115499 scopus 로고    scopus 로고
    • An Economics Model of Supportability through Design for Testability
    • L. Y. Ungar, "An Economics Model of Supportability through Design for Testability", Proc. AUTOTESTCON 2006, 2006.
    • (2006) Proc. AUTOTESTCON 2006
    • Ungar, L.Y.1
  • 19
    • 57949113261 scopus 로고    scopus 로고
    • Previously unpublished report of an experiment involving, OptoTherm, WesTest and A.T.E. Solutions, Inc. on August 25, 2005. Of 10 faults injected in 5 different boards, all faults were successfully identified and locations on the boards exactly pinpointed. Faults injected were groundings and shorting pins to VCC.
    • Previously unpublished report of an experiment involving, OptoTherm, WesTest and A.T.E. Solutions, Inc. on August 25, 2005. Of 10 faults injected in 5 different boards, all faults were successfully identified and locations on the boards exactly pinpointed. Faults injected were groundings and shorting pins to VCC.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.