Knowledge base to manage the grading and selection of testability guidelines

AUTOTESTCON (Proceedings)

Volumn 2005, Issue , 2005, Pages 444-450

  Ungar, Louis Y ^a   Parameswaran, Rajini ^a  

^a ATE Solutions Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT (ATE); DESIGN ACTIVITY; TESTENABLIST;

BUILT-IN SELF TEST; DESIGN FOR TESTABILITY; INSTRUMENT TESTING; STRUCTURAL DESIGN;

KNOWLEDGE MANAGEMENT;

EID: 33847730245     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AUTEST.2005.1609177     Document Type: Conference Paper

References (7)

1. Department of Defense, MIL-Std-2165, Testability Program for Electronic Systems and Equipment 26 January 1985.
2. Department of Defense, MIL-HDBK-2165. Testability Program for Electronic Systems and Equipment 31 July 1995
3. United Kingdom Ministry of Defence Standard 00-13/Issue 3, 17 June 1994.
4. Surface Mount Technology Association, SMTA Testability Guidelines 101C, 2002.
5. Colin Maunder, The Board Designer's Guide to Testable Logic Circuits, Addison Wesley, 1992
6. Frank F. Tsui, LSI/VLSI Testability Design, McGraw Hill, 1987.
7. A.T.E. Solutions, Inc., The Testability Director, Version 3.2, 2005. http://www.besttest.com/OurProducts/TestabilityDirector/