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Volumn 47, Issue 23, 2008, Pages 9447-9456

Fault diagnosis based on signed digraph combined with dynamic kernel PLS and SVR

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL INDUSTRY;

EID: 57949096972     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie8009457     Document Type: Article
Times cited : (12)

References (24)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.