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Volumn , Issue , 2007, Pages 241-244

An 8T Subthreshold SRAM Cell Utilizing Reverse Short Channel Effect for Write Margin and Read Performance Improvement

Author keywords

[No Author keywords available]

Indexed keywords

CYTOLOGY; INTEGRATED CIRCUITS; THRESHOLD VOLTAGE;

EID: 57849151111     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2007.4405723     Document Type: Conference Paper
Times cited : (35)

References (10)
  • 3
    • 33744719678 scopus 로고    scopus 로고
    • Back-gate controlled READ SRAM with improved stability
    • Oct.
    • J. Kim, K. Kim, C. T. Chuang, "Back-gate controlled READ SRAM with improved stability", SOI Conference, pp. 211-212, Oct. 2005.
    • (2005) SOI Conference , pp. 211-212
    • Kim, J.1    Kim, K.2    Chuang, C.T.3
  • 5
    • 0024755327 scopus 로고
    • Reverse short-channel effects on threshold voltage in submicrometer salicide devices
    • Oct.
    • C. Y. Lu, J. M. Song, "Reverse short-channel effects on threshold voltage in submicrometer salicide devices", IEEE Electron Device Letters, Volume 10, pp. 446-448, Oct. 1989
    • (1989) IEEE Electron Device Letters , vol.10 , pp. 446-448
    • Lu, C.Y.1    Song, J.M.2
  • 6
    • 0029545617 scopus 로고
    • Reverse short channel effect and channel length dependence of boron penetration in PMOSFETs
    • Dec.
    • C. Subramanian, J. Hayden, W. Taylor, et al., "Reverse short channel effect and channel length dependence of boron penetration in PMOSFETs", International Electron Devices Meeting, pp. 423-426, Dec. 1995.
    • (1995) International Electron Devices Meeting , pp. 423-426
    • Subramanian, C.1    Hayden, J.2    Taylor, W.3
  • 9
    • 0016572578 scopus 로고
    • The effect of randomness in the distribution of impurity atoms on FET threshold
    • R. Keyes, "The effect of randomness in the distribution of impurity atoms on FET threshold", Applied Physics A: Material Science Process., vol. 8, pp. 251-259, 1975.
    • (1975) Applied Physics A: Material Science Process. , vol.8 , pp. 251-259
    • Keyes, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.