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Volumn 393, Issue 2, 2009, Pages 623-634

Nondestructive characterization of nanoscale layered samples

Author keywords

XRF; Density; Elements; Homogeneity; Layers; Oxides; Purity; RBS; Roughness; Sequence; SRXRF; Thickness; WDXRF; XRR

Indexed keywords

SECONDARY ION MASS SPECTROMETRY;

EID: 57849097476     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-008-2465-2     Document Type: Article
Times cited : (9)

References (28)
  • 1
    • 1842639405 scopus 로고    scopus 로고
    • Hutcheson GD (2004) Sci Am 290(4):76-83
    • (2004) Sci Am , vol.290 , Issue.4 , pp. 76-83
    • Hutcheson, G.D.1
  • 9
    • 57849160407 scopus 로고    scopus 로고
    • IDL software webpage
    • ITT Visual Information Solutions, Boulder, CO. last accessed 14 Oct 2008
    • ITT Visual Information Solutions (2008) IDL software webpage. ITT Visual Information Solutions, Boulder, CO. http://www.ittvis.com/ProductServices/IDL. aspx, last accessed 14 Oct 2008
    • (2008) ITT Visual Information Solutions


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.