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Volumn 393, Issue 2, 2009, Pages 623-634
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Nondestructive characterization of nanoscale layered samples
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Author keywords
XRF; Density; Elements; Homogeneity; Layers; Oxides; Purity; RBS; Roughness; Sequence; SRXRF; Thickness; WDXRF; XRR
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Indexed keywords
SECONDARY ION MASS SPECTROMETRY;
DENSITY;
ELEMENTS;
HOMOGENEITY;
LAYERS;
PURITY;
RBS;
ROUGHNESS;
SEQUENCE;
SRXRF;
THICKNESS;
WDXRF;
XRR;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
ALUMINUM;
COBALT;
COPPER;
NANOMATERIAL;
NICKEL;
ARTICLE;
NANOTECHNOLOGY;
PARTICLE SIZE;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY;
SURFACE PROPERTY;
ALUMINUM;
COBALT;
COPPER;
NANOSTRUCTURES;
NANOTECHNOLOGY;
NICKEL;
PARTICLE SIZE;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY, X-RAY EMISSION;
SURFACE PROPERTIES;
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EID: 57849097476
PISSN: 16182642
EISSN: 16182650
Source Type: Journal
DOI: 10.1007/s00216-008-2465-2 Document Type: Article |
Times cited : (9)
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References (28)
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