Controlled growth and formation of SAMs investigated by atomic force microscopy

Ultramicroscopy

Volumn 109, Issue 2, 2009, Pages 161-166

  Pillai, Saju ^a   Pai, Ranjith Krishna ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

Atomic force microscopy (AFM); Self assembled monolayers; Surfaces; Thin films

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CONTACT ANGLE; ELECTRON ENERGY LEVELS; GROWTH (MATERIALS); HUMIDITY CONTROL; HYDROCHLORIC ACID; MONOLAYERS; SILANES; THIN FILMS; WATER CONTENT;

ADSORPTION TIMES; ATOMIC FORCE MICROSCOPY (AFM); BIOLOGICAL APPLICATIONS; CHLOROSILANE; CONTROLLED GROWTHS; EXPANSION PROCESSES; GROWTH MECHANISMS; ISLAND MORPHOLOGIES; MONOLAYER FORMATIONS; MONOLAYER GROWTHS; MONOLAYER THICKNESSES; OCTADECYLSILOXANE; OCTADECYLTRICHLOROSILANE; OCTADECYLTRIMETHOXY SILANES; OVER SURFACES; REACTIVE SILANES; SIMPLE METHODS; SLOW GROWTH RATES; STRAIGHTFORWARD METHODS; SURFACE COVERAGES;

SELF ASSEMBLED MONOLAYERS;

HYDROCHLORIC ACID; OCTADECYLSILOXANE; OCTADECYLTRICHLOROSILANE; OCTADECYLTRIMETHOXYSILANE; SELF ASSEMBLED MONOLAYER; SILANE DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; GROWTH RATE; GROWTH REGULATION; HYDROLYSIS; WATER CONTENT;

EID: 57749174538     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.10.002     Document Type: Article

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