Local structure of the high-temperature thermoelectric material PbTe using the maximum entropy method (MEM) and pair distribution function (PDF)

Journal of Physics and Chemistry of Solids

Volumn 70, Issue 1, 2009, Pages 159-163

  Saravanan, R ^a   Robert, M Charles ^b  

^a MADURAI KAMARAJ UNIVERSITY   (India)

^b Hajee Karutha Rowther Howdia College   (India)

Author keywords

A. Inorganic compounds; A. Semiconductors; C. X ray diffraction; D. Crystal structure; D. Transport properties

Indexed keywords

BOND LENGTH; CARRIER CONCENTRATION; CRYSTALS; DIFFRACTION; DISTRIBUTION FUNCTIONS; ELECTRIC CONDUCTIVITY; ELECTRON DENSITY MEASUREMENT; ELECTRONIC DENSITY OF STATES; ELECTRONS; INORGANIC COMPOUNDS; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; THERMOELECTRIC EQUIPMENT; TRANSPORT PROPERTIES; X RAY ANALYSIS; X RAY DIFFRACTION;

A. INORGANIC COMPOUNDS; A. SEMICONDUCTORS; C. X-RAY DIFFRACTION; D. CRYSTAL STRUCTURE; D. TRANSPORT PROPERTIES;

CRYSTAL STRUCTURE;

EID: 57649155306     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2008.09.022     Document Type: Article

References (29)

1. Hsu K., Loo S., Guo F., et al. Science 303 (2004) 818
2. Thompson K., Lawrence D., Larson D.J., et al. Ultramicroscopy 107 2-3 (2006) 131
3. Goldsmid H.J. Electronic Refrigeration (1986), Pion, London
4. Hicks L.D., Harman T.C., Sun X., and Dresselhaus M.S. Phys. Rev. B 53 (1996) 10493
5. Hideyuki Y., et al. J. Jpn. Inst. Met. 63 11 (1999) 1468
6. Heremans J.P., Jovovic V., Toberer E.S., Saramat A., Kurosaki K., Charoenphakdee A., Yamanaka S., and Snyder G.J. Science 321 (2008) 554
7. Kosuga A., Kurosaki K., Mutam H., and Yamanaka S. J. Alloys Compd. 416 (2006) 218
8. Marquis E.A., Hekmaty M., Morales A., and Medlin D.L. Microsc. Microanal. 13 Suppl 2 (2007) 8
9. Zauny M. Phys. Rev. B 39 (1989) 12948
10. Lukovića D., Königb W., Blagojevićc V., Jakšićd O., and Nikolića P.M. Mater.Res. Bull. 42 (2006) 367
11. Dashevsky Z., Kreizman R., and Dariel M.P. J. Appl. Phys. 98 (2005) 094309
12. Rietveld H.M. J. Appl. Crystallogr. 2 (1969) 65
13. Collins D.M. Nature 298 (1982) 49
14. Israel S., Saravanan R., Srinivasan N., and Rajaram R.K. J. Phys. Chem. Solids 64 (2003) 43
15. Israel S., Saravanan R., and Rajaram R.K. Physica B 349 (2004) 390
16. Sakata M., and Sato M. Acta Crystallogr. A 42 (1990) 263
17. Yamamoto K., Takahashi Y., Ohshima K., Okamura F.B., and Yukino K. Acta Crystallogr. A 52 (1996) 606
18. Egami T., and Billinge S.J.L. Underneath the Bragg Peaks: Structural Analysis of Complex Material (2003), Oxford University Press, London
19. Egami T. JIM 31 3 (1990) 163
20. Petkov V., Billinge S.J.L., Larsan P., Mahanthi S.D., Vogt T., Rangen K.K., and Kanatzidis M.G. Phys. Rev. B 65 (2002) 092105
21. Proffen T., and Billinge S.J.L. J. Appl. Crystallogr. 32 (1999) 572
22. Toby B.H., and Egami T. Acta Crystallogr. A 48 (1992) 336
23. Holland T.J.B., and Redfern S.A.T. Unit cell refinement from powder diffraction 8 data the use of regression diagnostics. Mineral. Mag. 61 (1997) 65
24. Wyckoff R.W.G. Crystal Structures I (1963), Inter-Science Publishers, London
25. V. Petříček, M Dušek, L. Palatinus, JANA 2000, The Crystallographic Computing System. Institute of Physics, Academy of Sciences of the Czech Republic, Praha, 2000.
26. Izumi F., and Dilanian R.A. Recent Research Developments in Physics, Part II 3 (2002), Transworld Research Network, Trivandrum pp. 699-726
27. K. Momma, F. Izumi, Commission on the Crystallographic Computing system, IUCr Newsletter no. 7:106, 2006.
28. Jeong I.K., Thompson J., Proffen Th., Perez A., and Billinge S.J.L. PDFGetX, A program for obtaining the atomic pair distribution function from X-ray powder diffraction data (2001)
29. Farrow C.L., Juhás P., Liu J.W., Bryndin D., Bozin E.S., Bloch J., Proffen Th., and Billinge S.J.L. PDFfit2 and PDFgui: computer programs for studying nanostructure in crystals. J. Phys.: Condens. Matter 19 (2007) 335219