Wettability of model fountain solutions: The influence on topo-chemical and -physical properties of offset paper

Journal of Colloid and Interface Science

Volumn 330, Issue 2, 2009, Pages 428-436

  Tag C M ^a   Pykonen M ^a   Rosenholm, J B ^a   Backfolk, K ^b  

^a ÅBO AKADEMI UNIVERSITY   (Finland)

^b Stora Enso   (Finland)

Author keywords

AFM; Contact angle; Fountain solution; Surfactant; ToF SIMS; XPS

Indexed keywords

ANGLE MEASUREMENT; CHEMICAL PROPERTIES; CONTACT ANGLE; ELECTRON SPECTROSCOPY; FOUNTAINS; INTERFACIAL ENERGY; MASS SPECTROMETERS; MASS SPECTROMETRY; NEGATIVE IONS; OXYGEN; PAPER; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTRUM ANALYSIS; SURFACE ACTIVE AGENTS; SURFACE CHEMISTRY; SURFACE TENSION; X RAY PHOTOELECTRON SPECTROSCOPY;

AFM; FOUNTAIN SOLUTION; SURFACTANT; TOF-SIMS; XPS;

SURFACE PROPERTIES;

2 PROPANOL; CARBON; OXYGEN; SURFACTANT;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CONTACT ANGLE; ENERGY; MASS; MATERIAL COATING; MIGRATION; PAPER; PRINTING; PRIORITY JOURNAL; SURFACE PROPERTY; SURFACE TENSION; TIME OF FLIGHT MASS SPECTROMETRY; TOPOGRAPHY; WETTABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANIONS; CONTACT ANGLE; FOUNTAIN SOLUTIONS; MASS SPECTROMETERS; MASS SPECTROSCOPY; MICROSCOPY; MIGRATION; PAPER PROPERTIES; PROPANOLS; ROUGHNESS; SPECTROSCOPY; SURFACE ENERGY; SURFACTANTS; SWELLING; WETTABILITY;

EID: 57449084327     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2008.10.058     Document Type: Article

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