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Volumn 249, Issue 1-4, 2005, Pages 393-407
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ToF-SIMS imaging: A valuable chemical microscopy technique for paper and paper coatings
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Author keywords
Coating; EDS; FE SEM; Latex; Pulp fibres; Sizing; ToF SIMS; XPS
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Indexed keywords
CHEMICALS;
LATEXES;
MORPHOLOGY;
PAPER COATING;
PAPERBOARDS;
PULP;
SCANNING ELECTRON MICROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHEMICAL MAPPING;
CHEMICAL MICROSCOPY TECHNIQUE;
PULP FIBERS;
TOF-SIMS;
PAPERMAKING;
ADDITIVES;
ANATOMY;
LATEX;
PAPER BOARDS;
PAPER MAKING;
PULPS;
SCANNING ELECTRON MICROSCOPY;
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EID: 21244494007
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.12.041 Document Type: Article |
Times cited : (54)
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References (22)
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