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Volumn 249, Issue 1-4, 2005, Pages 393-407

ToF-SIMS imaging: A valuable chemical microscopy technique for paper and paper coatings

Author keywords

Coating; EDS; FE SEM; Latex; Pulp fibres; Sizing; ToF SIMS; XPS

Indexed keywords

CHEMICALS; LATEXES; MORPHOLOGY; PAPER COATING; PAPERBOARDS; PULP; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 21244494007     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.12.041     Document Type: Article
Times cited : (54)

References (22)
  • 8
    • 85061688958 scopus 로고
    • Anon Anal. Chem. 67 1995 515A
    • (1995) Anal. Chem. , vol.67
  • 13
    • 14244251793 scopus 로고    scopus 로고
    • I. Rezandra R. Eschbach The Society for Imaging and Technology Springfield
    • J. Pinto, and M. Nicholas I. Rezandra R. Eschbach Recent Progress in Ink Jet Technologies 1999 The Society for Imaging and Technology Springfield 383
    • (1999) Recent Progress in Ink Jet Technologies , pp. 383
    • Pinto, J.1    Nicholas, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.