Correcting for surface roughness: Advancing and receding contact angles

Langmuir

Volumn 18, Issue 16, 2002, Pages 6465-6467

  Taniguchi, Masahide ^a   Belfort, Georges ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RECEDING CONTACT ANGLES;

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROPHILICITY; MOLECULAR WEIGHT; WETTING;

SURFACE ROUGHNESS;

EID: 0037031460     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la020145e     Document Type: Article

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