Probing paper surfaces with ToF SIMS: A new problem solving tool

Tappi Journal

Volumn 81, Issue 2, 1998, Pages 152-156

  Kulick, Russell J ^a   Brinen, Jacob S ^a  

^a CYTEC INDUSTRIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGENTS; DEFECTS; PAPERMAKING; PROBLEM SOLVING; SECONDARY ION MASS SPECTROMETRY; SIZING (FINISHING OPERATION); SURFACES;

DESIZING AGENTS; PITCH; TIME OF FLIGHT SECONDARY ION MASS SPECTROSCOPY;

PAPER;

EID: 0032002584     PISSN: 07341415     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review

References (9)

1. Benninghoven, A., Hagenhoff, B., and Niehuis, E., Anal. Chem. 65:630A(1993).
2. Brinen, J. S., Greenhouse, S., and Dunlop-Jones, S., Nordic Pulp Paper Res. J. 6(2):47(1991).
3. Brinen, J. S. and Proverb, R., Nordic Pulp Paper Res. J. 6(4):177(1991).
4. Brinen, J. S., Nordic Pulp Paper Res. J. 8(1):123(1993).
5. Zimmerman, P. A., Hercules, D. M., Rulle, H., et al., Tappi J. 78(2):180(1995).
6. Benninghoven, A., Phys. Status Solids 35:K169(1969).
7. Briggs, D. and Hearn, M., Vacuum 36:1005(1986).
8. Hearn, M. and Briggs, D., Surface and Interface Anal. 9:411(1986).
9. Brinen, J. S. and Kulick, R., Intl. J. of Mass Spec. and Ion Processes 143:177(1995).