Nano- and micro-scale resolution in ancient obsidian artefact surfaces: The impact of AFM on the obsidian hydration dating by SIMS-SS

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 12, 2008, Pages 3704-3707

  Liritzis, I ^a   Laskaris, N ^a   Bonini, M ^b  

^a UNIVERSITY OF THE AEGEAN   (Greece)

^b CSGI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCES; INITIAL TESTS; NATURAL GLASSES; SECONDARY IONS; SMOOTHED SURFACES; SURFACE IRREGULARITIES; SURFACE SATURATIONS;

ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; MASS SPECTROMETRY; NANOTECHNOLOGY; SECONDARY ION MASS SPECTROMETRY; SURFACE ROUGHNESS;

NANOELECTRONICS;

EID: 57349113031     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200780192     Document Type: Conference Paper

References (7)

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5. I. Liritzis et al., J. Radioanal. Nucl. Chem. 261(1), 51 (2004).
6. I. Liritzis and T. Ganetsos. Appl. Surf. Sci. 252(19), 7144 (2006).
7. I. Liritzis, M. Bonini, and N. Laskaris, Surf. Interface Anal. 40, 458 (2008).