Obsidian hydration dating from SIMS H + profiling based on saturated surface (SS) layer using new software

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7144-7147

  Liritzis, I ^a   Ganetsos, Th ^b  

^a UNIVERSITY OF THE AEGEAN   (Greece)

^b TEI of Lamia   (Greece)

Author keywords

Archaeological; Dating; Diffusion; Obsidians; SIMS; Software

Indexed keywords

COMPUTER SOFTWARE; DIFFUSION; SECONDARY ION MASS SPECTROMETRY; SENSITIVITY ANALYSIS; SURFACE CHEMISTRY;

AGE SENSITIVITY; ARCHAEOLOGICAL AGE; OBSIDIANS; SURFACE SATURATION LAYER LOCATION;

GEOCHRONOLOGY;

EID: 33747168810     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.201     Document Type: Article

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