Quantitative phase measurement in coherent diffraction imaging

Optics Express

Volumn 16, Issue 5, 2008, Pages 3342-3348

  Clark, J N ^a   Williams, G J ^b   Quiney, H M ^b   Whitehead, L ^b   De Jonge, M D ^c,d   Hanssen, E ^a   Altissimo, M ^e   Nugent, K A ^b   Peele, A G ^a  

^a LA TROBE UNIVERSITY   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d AUSTRALIAN SYNCHROTRON   (Australia)

^e CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; DIFFRACTIVE OPTICS; NANOSTRUCTURED MATERIALS; PHASE MEASUREMENT; PRECIOUS METALS; SPATIAL VARIABLES CONTROL;

FRESNEL COHERENT DIFFRACTIVE IMAGING; PHASE RETRIEVAL;

IMAGING SYSTEMS;

ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE QUALITY; MATERIALS TESTING; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; REFRACTOMETRY; X RAY DIFFRACTION;

MATERIALS TESTING; RADIOGRAPHIC IMAGE ENHANCEMENT; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; REFRACTOMETRY; TOMOGRAPHY, OPTICAL COHERENCE; X-RAY DIFFRACTION;

EID: 40349113290     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.003342     Document Type: Article

References (16)