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Chemical Society Reviews
Volumn 30, Issue 1, 2001, Pages 26-35
Structural information from ion mobility measurements: Applications to semiconductor clusters
(4)
Shvartsburg, Alexandre A
a
Hudgins, Robert R
a
Dugourd, Philippe
a
Jarrold, Martin F
a
a
NORTHWESTERN UNIVERSITY
(
United States
)
Author keywords
[No Author keywords available]
Indexed keywords
EID
:
57249097724
PISSN
:
03060012
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1039/a802099j
Document Type
:
Review
Times cited : (
106
)
References (
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