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Volumn 81, Issue 21, 1998, Pages 4616-4619

Dissociation energies of silicon clusters: A depth gauge for the global minimum on the potential energy surface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000346827     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.4616     Document Type: Article
Times cited : (76)

References (37)
  • 14
    • 0004237241 scopus 로고
    • C. Y. Ng, T. Baer, and I. Powis, Wiley, Chichester
    • M. F. Jarrold, in Cluster Ions, C. Y. Ng, T. Baer, and I. Powis (Wiley, Chichester, 1993), p. 166.
    • (1993) Cluster Ions , pp. 166
    • Jarrold, M.F.1
  • 36
    • 85037206499 scopus 로고
    • Department of Chemistry, Texas A&M University
    • R. W. Schmude Jr., Ph.D. dissertation, Department of Chemistry, Texas A&M University, 1994.
    • (1994) Ph.D. Dissertation
    • Schmude, R.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.