Probing the density of states in a metal-oxide-semiconductor field-effect transistor

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 19, 2008, Pages

  Calvet, L E ^a   Snyder, J P ^b   Wernsdorfer, W ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b Université J Fourier ^*

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 57149130001     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.193309     Document Type: Article

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