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Volumn , Issue , 2005, Pages 728-731

A novel correlated double sampling poly-si circuit for readout systems in large area x-ray sensors

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATED DOUBLE SAMPLING; LOW-POWER CONSUMPTION; OFFSET CANCELLATION; POLY-SI; READOUT ELECTRONICS; THRESHOLD VOLTAGE VARIATION; X RAY SENSORS;

EID: 57049112994     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1464691     Document Type: Conference Paper
Times cited : (4)

References (12)
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    • Moy, J.P., Large area X-ray detectors based on amorphous silicon technology. Thin Solid Films, 1999. 337: p. 213-221.
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    • Moy, J.P.1
  • 4
    • 0036869785 scopus 로고    scopus 로고
    • Solid state X-ray imagers
    • Izumi, Y., Yamane, Y., Solid state X-ray imagers. MRS Bulletin, 2002. 27(11): p. 889-893.
    • (2002) MRS Bulletin , vol.27 , Issue.11 , pp. 889-893
    • Izumi, Y.1    Yamane, Y.2
  • 6
    • 0030291336 scopus 로고    scopus 로고
    • AMLCD manufacturing
    • Morozumi, S., AMLCD manufacturing. SID Information Display, 1996. 12-11: p. 18-23.
    • (1996) SID Information Display , vol.12 -11 , pp. 18-23
    • Morozumi, S.1
  • 7
    • 0032651110 scopus 로고    scopus 로고
    • Self-scanned amorphous silicon AMLCDs
    • Stewart, R.G., Self-scanned amorphous silicon AMLCDs. SID Information Display, 1999. 15(3): p. 12-16.
    • (1999) SID Information Display , vol.15 , Issue.3 , pp. 12-16
    • Stewart, R.G.1
  • 8
    • 0026173695 scopus 로고
    • CMOS circuits for peripheral integrated poly-Si TFT LCD fabricated at low temperature below 600° C
    • June
    • Takabatake M., O.J., Ono Y., Ono K., Mimura A., Konishi N., CMOS circuits for peripheral integrated poly-Si TFT LCD fabricated at low temperature below 600° C. IEEE Trans. Electron Devices, June 1991. 38(6): p. 1303-1309.
    • (1991) IEEE Trans. Electron Devices , vol.38 , Issue.6 , pp. 1303-1309
    • Takabatake, M.O.J.1    Ono, Y.2    Ono, K.3    Mimura, A.4    Konishi, N.5
  • 11
    • 0037247587 scopus 로고    scopus 로고
    • Amorphous silicon active pixel sensor readout circuit for digital imaging
    • January
    • Karim, K.S., Nathan, A., Rowlands, J.A., Amorphous silicon active pixel sensor readout circuit for digital imaging. IEEE Transactions on Electron Devices, January 2003. 50(1): p. 200-208.
    • (2003) IEEE Transactions on Electron Devices , vol.50 , Issue.1 , pp. 200-208
    • Karim, K.S.1    Nathan, A.2    Rowlands, J.A.3
  • 12
    • 0040363061 scopus 로고    scopus 로고
    • Low frequency noise in gate overlapped lightly doped drain polycrystalline silicon thin-film transistors
    • May
    • Giovannini, S., Bove, A., Valletta, A., Mariucci, L., Pecora, A. , Fortunato, G., Low frequency noise in gate overlapped lightly doped drain polycrystalline silicon thin-film transistors. App. Phys. Lett, May 2000. 72(20).
    • (2000) App. Phys. Lett , vol.72 , Issue.20
    • Giovannini, S.1    Bove, A.2    Valletta, A.3    Mariucci, L.4    Pecora, A.5    Fortunato, G.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.