Strong inter-conduction-band absorption in heavily fluorine doped tin oxide

Applied Surface Science

Volumn 255, Issue 5 PART 1, 2008, Pages 1874-1879

  Canestraro, Carla D ^a,b   Oliveira, Marcela M ^b   Valaski, Rogério ^b   da Silva, Marcus V S ^c   David, Denis G F ^c   Pepe, Iuri ^c   Silva, Antonio Ferreira da ^c   Roman, Lucimara S ^b   Persson, Clas ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c FEDERAL UNIVERSITY OF BAHIA   (Brazil)

Author keywords

Doping; Optical absorption; Resistivity; Tin oxide; Transparent conducting film

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CONDUCTION BANDS; DEFECT DENSITY; DENSITY FUNCTIONAL THEORY; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ENERGY GAP; LIGHT ABSORPTION; NANOCOMPOSITES; SEMICONDUCTOR DOPING; SPRAY PYROLYSIS;

DOPED TIN OXIDES; ELECTRICAL AND STRUCTURAL PROPERTIES; FLUORINE DOPED TIN OXIDE; OPTICAL BAND EDGE ABSORPTION; SPRAY-PYROLYSIS TECHNIQUES; STRONG ABSORPTIONS; TRANSPARENT CONDUCTING FILMS; X RAY FLUORESCENCE;

TIN OXIDES;

EID: 56949095313     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.06.113     Document Type: Article

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