Morphology dependence on fluorine doped tin oxide film thickness studied with atomic force microscopy

Microscopy and Microanalysis

Volumn 11, Issue SUPPL. 3, 2005, Pages 118-121

  Macedo, A G ^a   Cava, C E ^a   Canestraro, C D ^a   Contini, L ^a   Roman, L S ^a  

^a FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

Author keywords

Atomic force microscopy; Conducting transparent oxides; Fluorine doped tin oxide; Grain size; Morphology; Sheet resistance; Tin oxide

Indexed keywords

EID: 33750704968     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927605051032     Document Type: Article

References (10)

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10. We would like to acknowledge the financial support from CAPES, CNPq, CT-ENERG/CNPq and REMAN/CNPq.