Experimental determination of valence band offset at PbTe/CdTe(111) heterojunction interface by x-ray photoelectron spectroscopy

Applied Physics Letters

Volumn 93, Issue 20, 2008, Pages

  Si, Jianxiao ^a   Jin, Shuqiang ^a   Zhang, Hanjie ^a   Zhu, Ping ^a   Qiu, Dongjiang ^a   Wu, Huizhen ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ELEMENTS; ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; ELECTRON SPECTROSCOPY; HETEROJUNCTIONS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; SPECTRUM ANALYSIS; VALENCE BANDS;

BAND ALIGNMENTS; CONDUCTION BAND OFFSETS; EXPERIMENTAL DETERMINATIONS; EXPERIMENTAL ERRORS; HETEROJUNCTION INTERFACES; PBTE/CDTE; VALENCE BAND OFFSETS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 56849128729     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3028028     Document Type: Article

References (21)

1. M. Rahim, M. Arnold, F. Felder, K. Behfar, and H. Zogg, Appl. Phys. Lett. 0003-6951 10.1063/1.2798254 91, 151102 (2007).
2. T. Schwarzl, G. Springholz, M. Boberl, E. Kaufmann, J. Roither, W. Heiss, J. Fürst, and H. Pascher, Appl. Phys. Lett. 0003-6951 10.1063/1.1853527 86, 031102 (2005).
3. D. V. Talapin and C. B. Murray, Science 0036-8075 10.1126/science.1116703 310, 86 (2005).
4. W. Heiss, H. Groiss, E. Kaufmann, G. Hesser, M. Boberl, G. Springholz, and F. Schaffler, Appl. Phys. Lett. 0003-6951 10.1063/1.2202107 88, 192109 (2006).
5. H. Groiss, E. Kaufmann, G. Springholz, T. Schwarzl, G. Hesser, F. Schäffler, W. Heiss, K. Koike, T. Itakura, and T. Hotei, M. Yano, and T. Wojtowicz, Appl. Phys. Lett. 0003-6951 10.1063/1.2817951 91, 222106 (2007).
6. R. Leitsmann and F. Bechstedt, Phys. Rev. B 0163-1829 10.1103/PhysRevB.76.125315 76, 125315 (2007).
7. T. N. Xu, H. Z. Wu, and J. X. Si, Phys. Rev. B 0163-1829 10.1103/PhysRevB.76.155328 76, 155328 (2007).
8. P. D. C. King, T. D. Veal, P. H. Jefferson, and C. F. Mcconville, Appl. Phys. Lett. 0003-6951 10.1063/1.2716994 90, 132105 (2007).
9. H. F. Wu, H. J. Zhang, Y. H. Lu, J. X. Si, H. Y. Li, S. N. Bao, H. Z. Wu, and P. He, Appl. Phys. Lett. 0003-6951 10.1063/1.2900900 92, 122112 (2008).
10. E. A. Kraut, R. W. Grant, J. R. Waldrop, and S. P. Kowalczyk, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.44.1620 44, 1620 (1980).
11. F. R. McFeely, S. Kowalczyk, L. Ley, R. A. Pollak, and D. A. Shirly, Phys. Rev. B 7, 5228 (1973).
12. T. M. Duc, C. Hsu, and J. P. Faurie, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.58.1127 58, 1127 (1987).
13. S. P. Kowalczyk, J. T. Cheung, E. A. Kraut, and R. W. Grant, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.56.1605 56, 1605 (1986).
14. A. Waag, Y. S. Wu, R. N. Bicknell-Tassius, C. Gonser-Buntrock, and G. Landwehr, J. Appl. Phys. 0021-8979 10.1063/1.347118 68, 212 (1990).
15. G. Bratina, L. Sorba, A. Antonini, G. Ceccone, R. Nicolini, G. Biasiol, A. Franciosi, J. E. Angelo, and W. W. Gerberich, Phys. Rev. B 0163-1829 10.1103/PhysRevB.48.8899 48, 8899 (1993).
16. G. Martin, A. Botchkarev, A. Rocket, and H. Morkoc, Appl. Phys. Lett. 0003-6951 10.1063/1.116177 68, 2541 (1996).
17. T. E. Cook, Jr., C. C. Fulton, W. J. Mecouch, K. M. Tracy, R. F. Davis, E. H. Hurt, G. Lucovsky, and R. J. Nemanich, J. Appl. Phys. 0021-8979 10.1063/1.1559424 93, 3995 (2003).
18. F. Cerrina, R. R. Daniels, and V. Fano, Appl. Phys. Lett. 0003-6951 10.1063/1.94273 43, 182 (1983).
19. S. H. Wei and A. Zunger, Phys. Rev. B 37, 8959 (1988).
20. S. H. Wei and A. Zunger, Phys. Rev. B 0163-1829 10.1103/PhysRevB.55.13605 55, 13605 (1997).
21. S. Yuan, H. Krenn, G. Springholz, and G. Bauer, Phys. Rev. B 0163-1829 10.1103/PhysRevB.47.7213 47, 7213 (1993).