Nanoscale wedge polishing of superconducting thin films - An easy way to obtain depth dependent information by surface analysis techniques

Superconductor Science and Technology

Volumn 21, Issue 10, 2008, Pages

  Shapoval, T ^a   Engel, S ^a   Grundlich M ^a   Meier, D ^a   Backen, E ^a   Neu, V ^a   Holzapfel, B ^a   Schultz, L ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COPPER; COST EFFECTIVENESS; ELECTRIC CONDUCTIVITY; HAFNIUM; MAGNETIC FORCE MICROSCOPY; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; POLISHING; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; SURFACE ANALYSIS; THICK FILMS; THIN FILMS;

CHEMICAL SOLUTION DEPOSITIONS; DOPED FILMS; DOPED SAMPLES; ELECTRON BACKSCATTERINGS; FLUX LINES; HIGH RESOLUTIONS; HOMOGENEOUS DISTRIBUTIONS; LOW TEMPERATURES; MAGNETIC FORCES; MICROSCOPIC STUDIES; NANOSCALE; PULSED LASERS; SCANNING TECHNIQUES; SENSITIVE TECHNIQUES; SUPERCONDUCTING PROPERTIES; SURFACE ANALYSIS TECHNIQUES; UNDOPED FILMS;

FILM PREPARATION;

EID: 56449102992     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/21/10/105015     Document Type: Article

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