Application of low-angle polishing for rapid assessment of the texture and morphology of thick film Y1Ba2Cu3O7 superconducting tapes

Physica C: Superconductivity and its Applications

Volumn 467, Issue 1-2, 2007, Pages 186-191

  Solovyov, Vyacheslav F ^a   Wiesmann, Harold J ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Coated conductor; Critical current; Diagnostics; Texture; Twin planes; YBCO

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); OPTICAL MICROSCOPY; TEXTURES; THICK FILMS; X RAY DIFFRACTION; YTTRIUM COMPOUNDS;

COATED CONDUCTORS; METALLOGRAPHIC POLISHING; TEXTURE QUALITY; TWIN PLANES;

SUPERCONDUCTING TAPES;

EID: 36149000903     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2007.10.005     Document Type: Article

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