ToF-SIMS study of chemical composition and formation of all-nanoparticle multilayer films

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 981-983

  Chen, Bo Jung ^a   Yin, Yu Sheng ^a   Ling, Yong Chien ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Formation; Homogeneity; Image; Multilayer films; Nanoparticle; ToF SIMS

Indexed keywords

ALUMINA; ALUMINUM OXIDE; DEPOSITION; MOLECULAR DYNAMICS; MULTILAYERS; NANOPARTICLES; SECONDARY ION MASS SPECTROMETRY; SILICA;

CHEMICAL COMPOSITIONS; FORMATION; HOMOGENEITY; IMAGE; LAYER BY LAYER DEPOSITION; MOLECULAR DYNAMICS SIMULATIONS; NANOPARTICLE MULTILAYERS; TOF SIMS;

MULTILAYER FILMS;

EID: 56449096925     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.162     Document Type: Article

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