Atomic distribution in quantum dots-A ToF-SIMS study

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7003-7005

  Chen, Wen Yin ^a   Ling, Yong Chien ^a   Chen, Bo Jung ^a   Wang, Chiung Chi ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

CdS; Depth profile; Image; Immobilization; ToF SIMS

Indexed keywords

CADMIUM SULFIDE; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY; SEMICONDUCTOR DOPING;

DEPTH PROFILE; IMMOBILIZATION; NANOCRYSTALS; TOF-SIMS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 33747191174     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.229     Document Type: Article

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