메뉴 건너뛰기




Volumn 252, Issue 19, 2006, Pages 6466-6469

Molecular dynamics study of particle emission by reactive cluster ion impact

Author keywords

Cluster; Fluorine; Molecular dynamics simulation; Sputtering process; Surface morphology

Indexed keywords

COMPUTER SIMULATION; FLUORINE COMPOUNDS; MORPHOLOGY; SPUTTERING; SURFACE PHENOMENA; TARGETS;

EID: 33747193277     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.195     Document Type: Article
Times cited : (6)

References (16)
  • 7
    • 33747187267 scopus 로고    scopus 로고
    • S. Ninomiya, T. Aoki, T. Seki, J. Matsuo, Secondary ion measurements for oxygen cluster ion SIMS, doi:10.1016/j.apsusc.2006.02.138.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.