MCs n + cluster formation on organic surfaces: A novel way to depth-profile organics?

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 973-976

  Mine, N ^a   Douhard, B ^a   Houssiau, L ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Cationisation; MCs clusters; Organic depth profile; Polymers

Indexed keywords

ATOMS; CESIUM; CLUSTER ANALYSIS; NEGATIVE IONS; ORGANIC POLYMERS; POLYMERS;

CATIONISATION; CLUSTER FORMATIONS; MCS CLUSTERS; MOLECULAR ANALYSIS; MOLECULAR DEPTH PROFILING; MOLECULAR FRAGMENTS; ORGANIC DEPTH PROFILE; POLYMER CHARACTERISTICS;

DEPTH PROFILING;

EID: 56449085700     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.033     Document Type: Article

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