Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imaging

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 1158-1161

  Kurczy, M E ^a   Kozole, Joseph ^a   Parry, S A ^a   Piehowski, P D ^a   Winograd, Nicholas ^a   Ewing, A G ^a,b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF GOTHENBURG   (Sweden)

Author keywords

C 60; Cluster; SIMS; Single cell

Indexed keywords

CELL MEMBRANES; DEPTH PROFILING; ION SOURCES; LIPIDS; SECONDARY ION MASS SPECTROMETRY;

CLUSTER; CONTROL-CELL; LIPOPHILIC DYES; MOLECULAR DEPTH PROFILING; RELATIVE QUANTIFICATION; SINGLE CELLS; SINGLE FRACTURE; TOF-SIMS IMAGING;

CYTOLOGY;

EID: 56449084165     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.018     Document Type: Article

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