Bulk and surface sensitivities of surface Plasmon waveguides

New Journal of Physics

Volumn 10, Issue , 2008, Pages

  Berini, Pierre ^a,b  

^a UNIVERSITY OF OTTAWA   (Canada)

^b Specialis Corp   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DETECTION; INTEGRATED CIRCUITS; INTEGRATED OPTICS; INTEGRATED OPTOELECTRONICS; METAL INSULATOR BOUNDARIES; MIM DEVICES; PHOTONICS; PLASMONS; SEMICONDUCTOR INSULATOR BOUNDARIES; SENSORS; SURFACES; WAVEGUIDES;

AD LAYERS; AND DETECTIONS; BIO-CHEMICALS; BULK SENSITIVITIES; CHEMICAL SENSING; DETECTION LIMITS; OPERATING WAVELENGTHS; OPTIMAL LENGTHS; PROPAGATION CONSTANTS; PROPAGATION LENGTHS; SENSOR ARCHITECTURES; SHORT WAVELENGTHS; SURFACE PLASMONS; SURFACE SENSING; SURFACE SENSITIVITIES; WAVEGUIDE DESIGNS;

WAVEGUIDE ATTENUATORS;

EID: 56349167584     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/10/105010     Document Type: Article

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