Normalized analysis for the design of evanescent-wave sensors and its use for tolerance evaluation

Optical and Quantum Electronics

Volumn 32, Issue 6, 2000, Pages 899-908

  Brioude, V ^a   Parriaux, O ^a  

^a UNIVERSITÉ JEAN MONNET   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FITS AND TOLERANCES; INSPECTION; INTERFACES (MATERIALS); OPTICAL SENSORS; OPTIMIZATION; SENSITIVITY ANALYSIS; ULTRATHIN FILMS;

EVANESCENT-WAVE SENSORS; WAVEGUIDE-COVER INTERFACES;

OPTICAL WAVEGUIDES;

EID: 0033717887     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1007030931823     Document Type: Article

References (5)

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3. Nellen, P.M., K. Tiefenthaler and W. Lukosz. Sensors and Actuators B 15 285, 1988.
4. Parriaux, O and G.J. Veldhuis. J. Lightwave Tech. 16 573, 1998.
5. Tien, P.K. Appl. Opt. 11-11 2395, 1971.