Disorder beneath epitaxial graphene on SiC(0001): An x-ray absorption study

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 20, 2008, Pages

  Gao, Xingyu ^a   Chen, Shi ^a   Liu, Tao ^a   Chen, Wei ^a   Wee, A T S ^a   Nomoto, T ^b   Yagi, S ^b   Soda, Kazuo ^b   Yuhara, Junji ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 56349163230     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.201404     Document Type: Article

References (21)

1. R. Rosei, S. Modesti, F. Sette, C. Quaresima, A. Savoia, and P. Perfetti, Phys. Rev. B 29, 3416 (1984). 10.1103/PhysRevB.29.3416
2. R. Rosei, M. De Crescenzi, F. Sette, C. Quaresima, A. Savoia, and P. Perfetti, Phys. Rev. B 28, 1161 (1983). 10.1103/PhysRevB.28.1161
3. A. Mattausch and O. Pankratov, Phys. Rev. Lett. 99, 076802 (2007). 10.1103/PhysRevLett.99.076802
4. S. Y. Zhou, G.-H. Gweon, A. V. Fedorov, P. N. First, W. A. De Heer, D.-H. Lee, F. Guinea, A. H. Castro Neto, and A. Lanzara, Nature Mater. 6, 770 (2007). 10.1038/nmat2003
5. S. Y. Zhou, D. A. Siegel, A. V. Fedorov, F. El Gabaly, A. K. Schmid, A. H. Castro Neto, D.-H. Lee, and A. Lanzara, Nature Mater. 7, 259 (2008). 10.1038/nmat2154b
6. W. Chen, H. Xu, L. Liu, X. Y. Gao, D. C. Qi, G. W. Peng, S. C. Tan, Y. P. Feng, K. P. Loh, and A. T. S. Wee, Surf. Sci. 596, 176 (2005).
7. S. W. Poon, W. Chen, E. S. Tok, and A. T. S. Wee, Appl. Phys. Lett. 92, 104102 (2008). 10.1063/1.2883941
8. X. Y. Gao, H. Xu, A. T. S. Wee, W. Kuch, C. Tieg, and S. Wang, J. Appl. Phys. 97, 103527 (2005). 10.1063/1.1915518
9. S. Yagi, G. Kutluk, T. Matsui, A. Matano, A. Hiraya, E. Hashimoto, and M. Taniguchi, Nucl. Instrum. Methods Phys. Res. A 467-468, 723 (2001). 10.1016/S0168-9002(01)00478-8
10. M. Naitoh, J. Takami, S. Nishigaki, and N. Toyama, Appl. Phys. Lett. 75, 650 (1999). 10.1063/1.124470
11. A. L. Ankudinov, B. Ravel, J. J. Rehr, and S. D. Conradson, Phys. Rev. B 58, 7565 (1998). 10.1103/PhysRevB.58.7565
12. A. H. Gomes de Mesquita, Acta Crystallogr. 1, 1948 (1967).
13. A. M. Haghiri-Gosnet, F. Rousseaux, E. Gat, J. Durand, and A. M. Flank, Microelectron. Eng. 17, 215 (1992). 10.1016/0167-9317(92)90044-R
14. Y. Baba, T. Sekiguchi, I. Shimoyama, and Krishna G. Nath, Appl. Surf. Sci. 237, 176 (2004). 10.1016/j.apsusc.2004.06.092
15. Y. H. Tang, T.-K. Sham, D. Yang, and L. Xue, Appl. Surf. Sci. 252, 3386 (2006). 10.1016/j.apsusc.2005.05.031
16. R. Nakajima, J. Stöhr, and Y. U. Idzerda, Phys. Rev. B 59, 6421 (1999). 10.1103/PhysRevB.59.6421
17. M. Krawczyk, L. Zommer, A. Kosinski, J. W. Sobczak, and A. Jablonski, Surf. Interface Anal. 38, 644 (2006). 10.1002/sia.2282
18. J. H. Hubbell and S. M. Seltzer, Tables of X-Ray Mass Attenuation Coefficients and Mass Energy-Absorption Coefficients, (NIST, Gaithersburg, 1996), from online database "NIST Standard Reference Database 126, online May 1996; last update July 2004," see http://physics.nist.gov/PhysRefData/ XrayMassCoef/cover.html.
19. K. L. More, J. Ryu, C. H. Carter, J. Bentley, and R. F. Davis, Cryst. Lattice Defects Amorphous Mater. 12, 243 (1985).
20. Z. H. Ni, W. C. Chen, X. F. Fan, J. L. Kuo, T. Yu, A. T. S. Wee, and Z. X. Shen, Phys. Rev. B 77, 115416 (2008). 10.1103/PhysRevB.77.115416
21. J. B. Hannon and R. M. Tromp, Phys. Rev. B 77, 241404 (R) (2008). 10.1103/PhysRevB.77.241404