Effects of the morphology of ZnO/Ag interface on the surface-plasmon- enhanced emission of ZnO films

Journal of Physics D: Applied Physics

Volumn 41, Issue 20, 2008, Pages

  You, J B ^a   Zhang, X W ^a   Fan, Y M ^a   Yin, Z G ^a   Cai, P F ^a   Chen, N F ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; EMISSION SPECTROSCOPY; METALLIC FILMS; PLASMONS; SEMICONDUCTING ZINC COMPOUNDS; SILVER; ZINC ALLOYS; ZINC OXIDE;

ATOMIC FORCES; CHARACTERISTIC PARAMETERS; DEPOSITION CONDITIONS; ENHANCED EMISSIONS; ENHANCEMENT RATIOS; INTER-LAYERS; SURFACE PLASMON COUPLINGS; ULTRAVIOLET EMISSIONS; ZNO FILMS;

SURFACE MORPHOLOGY;

EID: 56349149630     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/20/205101     Document Type: Article

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