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Applied Physics A: Materials Science and Processing

Volumn 94, Issue 1, 2009, Pages 117-122

The development of the physical and electrical characteristics of multi-layer TiO2-W-TiO2 thin films

(5) Yang, Cheng Fu a Huang, Hong Hsin b Chen, Cheng Yi b Huang, Ping Chih b Diao, Chien Chen c

a NATIONAL UNIVERSITY OF KAOHSIUNG (Taiwan)

b CHENG SHIU UNIVERSITY (Taiwan)

c KAO YUAN UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ENERGY GAP; GALLIUM ALLOYS; MAGNETRON SPUTTERING; OXIDE MINERALS; POWDERS; THICK FILMS; THIN FILM DEVICES; THIN FILMS; TITANIUM DIOXIDE; TITANIUM OXIDES; TUNGSTEN; VAPOR DEPOSITION;

ANATASE TIO; BAND GAPS; CRYSTAL INTENSITIES; ELECTRICAL CHARACTERISTICS; GLASS SUBSTRATES; LAYER STRUCTURES; LAYER THIN; MIDDLE LAYERS; PHASE RATIOS; RF MAGNETRON SPUTTERING; RUTILE AND ANATASES; X-RAY DIFFRACTIONS;

SOLIDS;

EID: 56349139495 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-008-4682-0 Document Type: Article

Times cited : (4)

References (15)

1
- 0004226931
- Springer Heidelberg
- H. Bach, D. Krause, Thin Films on Glass (Springer, Heidelberg, 1997)
- (1997) Thin Films on Glass
- Bach, H.¹ Krause, D.²

2
- 0031251431
- Y. Paz A. Heller 1997 J. Mater. Res. 12 2759
- (1997) J. Mater. Res. , vol.12 , pp. 2759
- Paz, Y.¹ Heller, A.²

3
- 0034200059
- J. Yu X. Zhao 2000 Mater. Res. Bull. 35 1293
- (2000) Mater. Res. Bull. , vol.35 , pp. 1293
- Yu, J.¹ Zhao, X.²

4
- 0029277646
- K.-N.P. Kumar 1995 Scr. Metall. Mater. 32 873
- (1995) Scr. Metall. Mater. , vol.32 , pp. 873
- Kumar, K.-N.P.¹

5
- 0032050984
- S. Gablenz D. Voltzke H.P. Abicht J.N. Zdralek 1998 J. Mater. Sci. Lett. 17 537
- (1998) J. Mater. Sci. Lett. , vol.17 , pp. 537
- Gablenz, S.¹ Voltzke, D.² Abicht, H.P.³ Zdralek, J.N.⁴

6
- 0030136539
- N.N. Lichtin M. Avudathai E. Berman A. Grayfer 1996 Sol. Energy 56 377
- (1996) Sol. Energy , vol.56 , pp. 377
- Lichtin, N.N.¹ Avudathai, M.² Berman, E.³ Grayfer, A.⁴

7
- 0342771639
- J. Augustynski 1993 Electrochim. Acta 38 43
- (1993) Electrochim. Acta , vol.38 , pp. 43
- Augustynski, J.¹

8
- 0032483884
- T.M. Wang H.Y. Wang P. Xu 1998 Thin Solid Films 334 103
- (1998) Thin Solid Films , vol.334 , pp. 103
- Wang, T.M.¹ Wang, H.Y.² Xu, P.³

9
- 45849087915
- R.A. Spurr H. Myers 1957 Anal. Chem. 29 769
- (1957) Anal. Chem. , vol.29 , pp. 769
- Spurr, R.A.¹ Myers, H.²

10
- 0141427833
- T. Miyagi M. Kamei T. Ogawa T. Mitsuhashi A. Yamazaki 2003 Thin Solid Films 442 32
- (2003) Thin Solid Films , vol.442 , pp. 32
- Miyagi, T.¹ Kamei, M.² Ogawa, T.³ Mitsuhashi, T.⁴ Yamazaki, A.⁵

11
- 0000442106
- T. Hashimoto T. Yoko S. Sakka 1994 Bull. Chem. Soc. Jpn. 67 653
- (1994) Bull. Chem. Soc. Jpn. , vol.67 , pp. 653
- Hashimoto, T.¹ Yoko, T.² Sakka, S.³

12
- 0344513940
- M. Sreemany S. Sen 2004 Mater. Chem. Phys. 83 169
- (2004) Mater. Chem. Phys. , vol.83 , pp. 169
- Sreemany, M.¹ Sen, S.²

13
- 0027579223
- L.J. Meng M.P. Dos Santos 1993 Thin Solid Films 226 22
- (1993) Thin Solid Films , vol.226 , pp. 22
- Meng, L.J.¹ Dos Santos, M.P.²

14
- 0031213381
- J. Aarik A. Aidla A.A. Kiisller T. Uustare V. Sammelselg 1997 Thin Solid Films 305 270
- (1997) Thin Solid Films , vol.305 , pp. 270
- Aarik, J.¹ Aidla, A.² Kiisller, A.A.³ Uustare, T.⁴ Sammelselg, V.⁵

15
- 0028368703
- H. Tang K. Prasad R. Sanjines P.E. Schmid F. Levy 1994 J. Appl. Phys. 75 2042
- (1994) J. Appl. Phys. , vol.75 , pp. 2042
- Tang, H.¹ Prasad, K.² Sanjines, R.³ Schmid, P.E.⁴ Levy, F.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.