Failure tests on 64 Mb SDRAM in radiation environment

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1999, Pages 158-164

  Bertazzoni, S ^a   Cardarilli, G C ^a   Piergentili, D ^a   Salmeri, M ^a   Salsano, A ^a   Giovenale, D Di ^a   Grande, G C ^a   Marinucci, P ^a   Sperandei, S ^a   Bartalucci, S ^a   Mazzenga, G ^a   Ricci, M ^a   Bidoli, V ^a   De Francesco, D ^a   Picozza, P G ^a  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLOTRON RADIATION; ELECTRIC SHIELDING; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS;

SYNCHRONOUS DYNAMIC RANDOM ACCESS MEMORY (SDRAM);

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0033334978     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)