XRD and FTIR analysis of Ti-Si-C-ON coatings for biomedical applications

Surface and Coatings Technology

Volumn 203, Issue 5-7, 2008, Pages 490-494

  Oliveira, Cristina ^a   Goncalves L ^a   Almeida, B G ^a   Tavares, C J ^a   Carvalho, S ^a   Vaz, F ^a   Escobar Galindo, R ^b   Henriques, M ^a   Susano, M ^a   Oliveira, R ^a  

^a UNIVERSITY OF MINHO   (Portugal)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Biofilm formation; FTIR; Resistivity; Sputtering

Indexed keywords

ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; BIOFILMS; BIOFILTERS; CRYSTAL STRUCTURE; ELECTRIC RESISTANCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; KETONES; MAGNETRON SPUTTERING; NONMETALS; OXYGEN; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SILICON; SODIUM CHLORIDE; TIN; TITANIUM CARBIDE; TITANIUM COMPOUNDS; TITANIUM NITRIDE; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ATOMIC RATIOS; BIOFILM FORMATION; BIOFILM FORMATIONS; BIOMEDICAL APPLICATIONS; CARBON ATOMS; COMPOSITIONAL ANALYSIS; DC REACTIVE MAGNETRON SPUTTERING; DIFFERENT PARTIAL PRESSURES; ELECTRICAL RESISTIVITIES; FTIR; FTIR ANALYSES; FTIR SPECTRUMS; INFRARED REFLECTIVITIES; LOW OXYGENS; NACL TYPES; OXYGEN CONTENTS; RESISTIVITY; SEMI-CONDUCTORS; STRETCHING MODES; XRD PATTERNS;

CRYSTAL ATOMIC STRUCTURE;

EID: 56149093654     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2008.06.121     Document Type: Article

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