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Volumn 56, Issue 20, 2008, Pages 6214-6223
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Controlled crack arrest in brittle thin films: The effect of embedded voids
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Author keywords
Fracture; Kinetics self organization patterning; Simulation; Thin films; Toughness
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Indexed keywords
INCLUSIONS;
THICK FILMS;
THIN FILMS;
BRITTLE THIN FILMS;
CRACK ANGLES;
CRACK ARRESTORS;
CRACK ARRESTS;
CRACK LENGTHS;
CRACK PATHS;
CRACK PATTERNS;
CRITICAL ANGLES;
FILM PROPERTIES;
INCLUSION SIZES;
SIMULATION;
STRESS SOLUTIONS;
VOID PATTERNS;
CRACKS;
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EID: 56049120305
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2008.08.038 Document Type: Article |
Times cited : (11)
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References (30)
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