Microstructures of beta-silicon carbide after irradiation creep deformation at elevated temperatures

Journal of Nuclear Materials

Volumn 382, Issue 2-3, 2008, Pages 170-175

  Katoh, Yutai ^a   Kondo, Sosuke ^a   Snead, Lance L ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CREEP; DEFORMATION; ELECTRON IRRADIATION; IRRADIATION; MICROSCOPIC EXAMINATION; MICROSTRUCTURAL EVOLUTION; MICROSTRUCTURE; RESIDUAL STRESSES; SILICON; SILICON CARBIDE; STRAIN; STRESS RELAXATION; THEOREM PROVING;

CREEP DEFORMATIONS; CREEP STRAINS; DISLOCATION LOOPS; ELEVATED TEMPERATURES; HIGH FLUX ISOTOPE REACTORS; INITIAL STRESSES; IRRADIATION CONDITIONS; IRRADIATION CREEPS; MATRIX DEFECTS; MICROSTRUCTURAL FEATURES; MONOCRYSTALLINE; PERMANENT STRAINS; POLYCRYSTAL LINES; THIN STRIPS;

NEUTRON IRRADIATION;

EID: 55949124149     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2008.08.012     Document Type: Article

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