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Volumn 18, Issue 10, 2008, Pages 515-520

Property of the nano-thick TiO2 films using an ALD at low temperature

Author keywords

ALD; Dye sensitized solar cell; Low temperature; Nano thickness; TiO2

Indexed keywords

ABSORPTION; ATOMS; BINDING ENERGY; BINDING SITES; ELECTROLYSIS; ENERGY GAP; GALLIUM ALLOYS; INFRARED DEVICES; NUCLEAR ENERGY; OXIDE MINERALS; PHOTOVOLTAIC CELLS; PHYSICAL VAPOR DEPOSITION; POTENTIAL ENERGY; PULSED LASER DEPOSITION; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; SOLIDS; THICK FILMS; THIN FILM DEVICES; THIN FILMS; TITANIUM DIOXIDE; TITANIUM OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 55949102680     PISSN: 12250562     EISSN: None     Source Type: Journal    
DOI: 10.3740/MRSK.2008.18.10.515     Document Type: Article
Times cited : (1)

References (27)
  • 6
    • 55949097323 scopus 로고    scopus 로고
    • Y. J. Shin, Polym. Sci. Tech., 17, 4 (2006).
    • Y. J. Shin, Polym. Sci. Tech., 17, 4 (2006).
  • 18
    • 55949095151 scopus 로고    scopus 로고
    • D. B. Williams, C. B. Carter, Transmission Electron Microscopy BasicsI, 1st ed., P.152-170, Plenum Press, NewYork, U.S.A. (1996).
    • D. B. Williams, C. B. Carter, Transmission Electron Microscopy BasicsI, 1st ed., P.152-170, Plenum Press, NewYork, U.S.A. (1996).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.