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Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

Soft x-ray measurements using photoconductive type-IIa and single-crystal chemical vapor deposited diamond detectors

(7) Moore, A S a Bentley, C D a Foster, J M a Goedhart, G a Graham, P a Taylor, M J a Hellewell, E b

a Plasma Physics Division (United Kingdom)

b MINISTRY OF DEFENCE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DIAMONDS; ELECTRIC CONDUCTIVITY; ELECTROMAGNETIC WAVES; LASERS; LIGHT; LIGHT SOURCES; LIGHTING; PHOTOCONDUCTIVITY; POWDERS; RESEARCH REACTORS; SYNCHROTRON RADIATION; VAPORS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BROOKHAVEN NATIONAL LABORATORIES; CALIBRATION MEASUREMENTS; CHEMICAL VAPOR DEPOSITED DIAMONDS; FLUX MEASUREMENTS; HIGH RESISTIVITIES; LABORATORY FOR LASER ENERGETICS; LASER FACILITIES; NATIONAL SYNCHROTRON LIGHT SOURCES; PHOTO INDUCED; PHOTOCONDUCTIVE DETECTORS; RADIOMETRIC CALIBRATIONS; RESPONSE TIMES;

CHEMICAL VAPOR DEPOSITION;

EID: 55349106615 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.2966375 Document Type: Conference Paper

Times cited : (4)

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