Soft x-ray power diagnostic improvements at the Omega Laser Facility

Review of Scientific Instruments

Volumn 77, Issue 10, 2006, Pages

  Sorce, C ^a   Schein, J ^a   Weber, F ^a   Widmann, K ^a   Campbell, K ^a,c   Dewald, E ^a   Turner, R ^a   Landen, O ^a   Jacoby, K ^b   Torres, P ^b   Pellinen, D ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b BECHTEL CORPORATION   (United States)

^c Acree Technologies   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DANTE SOFT X-RAY SPECTROMETER; OMEGA LASER FACILITY; RADIATION FLUX; RADIATION TEMPERATURES;

CALIBRATION; ELECTRON ENERGY LEVELS; HIGH TEMPERATURE APPLICATIONS; LASER PRODUCED PLASMAS; RADIATION; TEMPERATURE MEASUREMENT;

X RAY ANALYSIS;

EID: 33750496634     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2336462     Document Type: Conference Paper

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