A scanning tunneling microscopy observation of (√3 × √3) R30° reconstructed Ni2P(0001)

Japanese Journal of Applied Physics

Volumn 47, Issue 7 PART 3, 2008, Pages 6088-6091

  Kinoshlta, Kumiko ^a   Simon, Georg Hermann ^b   König, Thomas ^b   Heyde, Markus ^b   Freund, Hans Joachim ^b   Nakagawa, Yuta ^a   Suzuki, Shushi ^a,c   Chun, Wang Jae ^c,d   Oyama, Shigeo Ted ^e   Otani, Shigeki ^f   Asakura, Kiyotaka ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d INTERNATIONAL CHRISTIAN UNIVERSITY   (Japan)

^e State University   (United States)

^f NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

( 3 3) R30 reconstruction; Ni 3P2 terminated surface; Ni2P(0001) surface; Ni3P terminated surface; STM

Indexed keywords

ANNEALING; CRYSTAL ATOMIC STRUCTURE; MICROSCOPIC EXAMINATION; NICKEL ALLOYS; RESTORATION; SCANNING; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; ULTRAHIGH VACUUM; VACUUM;

ANNEALING CONDITIONS; ATOMIC ARRANGEMENTS; LOW TEMPERATURES; MODEL CATALYSIS; NI 3P2-TERMINATED SURFACE; NI2P(0001) SURFACE; NI3P-TERMINATED SURFACE; STM; STM IMAGES; TUNNELING MICROSCOPES; TWO TYPES;

NICKEL;

EID: 55149095193     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.6088     Document Type: Article

References (23)

1. W. R. A. M. Robinson, J. N. M. van Gastel, T. I. Korányi, S. Eijsbouts, A. M. van der Kraan, J. A. R. van Veen, V. H., and J. de Beer: J. Catal. 161 (1996) 539.
2. T. I. Korányi: Appl. Catal. A 239 (2003) 253.
3. W. Li, B. Dhandapani, and S. T. Oyatna: Chem. Lett. 27 (1998) 207.
4. C. Stinner, R. Prins, and Th. Weber: J. Catal. 191 (2000) 438.
5. C. Stinner, R. Prins, and Th. Weber: J. Catal. 202 (2001) 187.
6. P. Clark, W. Li, and S. T. Oyama: J. Catal. 200 (2001) 140.
7. S. T. Oyama, P. Clark, V. L. S. Teixiera da Silva, E. J. Lede, and F. G. Requejo: J. Phys. Chem. B 105 (2001) 4961.
8. C. Stinner, Z. Tang, M. Haouas, Th. Weber, and R. Prins: J. Catal. 208 (2002) 456.
9. S. T. Oyama, P. Clark, X. Wang, T. Shido, Y. lwasawa, S. Hayashi, J. M. Ramallo-Lopez, and F. G. Requejo: J. Phys. Chem. B 106 (2002) 1913.
10. S. T. Oyama: J. Catal. 216 (2003) 343.
11. D. Kanama, S. T. Oyama, S. Otani, and D. F. Cox: Surf. Sci. 552 (2004) 8.
12. M. G. Moula, S. Suzuki, W.-J. Chun, S. Otani, S. T. Oyama, and K. Asakura: Chem. Lett. 35 (2006) 90.
13. M. G. Moula, S. Suzuki, W.-J. Chun, S. Otani, S. T. Oyama, and K. Asakura: Surf. Interface Anal. 38 (2006) 1611.
14. P. Liu, J. A. Rodriguez, T. Asakura, J. Gomes, and K. Nakamura: J. Phys. Chem. B 109 (2005) 4575.
15. Q. Li and X. Hu: Phys. Rev. B 74 (2006) 035414.
16. Binary Alloy Phase Diagrams, ed. T. B. Massalski, H. Okamoto, P. R. Subramanian, and L. Kacprzak (AMS International, Materials Park, OH, 1992) 2nd ed., Vol. 3,
17. O. N. Ilnitskaya, L. G. Akselrad, S. I. Mikhalenko, and Y. B. Kuzma: Kristallografiya 32 (1987) 50 [in Russian].
18. M. Heyde, M. Kulawik, H.-P. Rust, and H.-J. Freund: Rev. Sci. Instrum. 75 (2004) 2446.
19. H.-P. Rust, M. Heyde, and H.-J. Freund: Rev. Sci. Instrum. 77 (2006) 043710.
20. R. Fruchart, A. Roger, and J. P. Senateur: J. Appl. Phys. 40 (1969) 1250.
21. S. Rundqvist: Acta Chem. Scand. 16 (1962) 992.
22. S. Suzuki, M. G. Moula, Y. Nakagawa, K. Kinoshita, T. Miyamoto, K. Asakura, S. T. Oyama, and S. Otani: to be published in J. Nanosci. Nanotechnol.
23. L. Jurczyszyn, A. Rosenhahn, J. Schneider, C. Becker, and K. Wandelt: Phys. Rev. B 68 (2003) 115425.