Surface structures of Ni2P (0001) - Scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED) characterizations

Surface and Interface Analysis

Volumn 38, Issue 12-13, 2006, Pages 1611-1614

  Moula, Md Golam ^a,b   Suzuki, Shushi ^a   Chun, Wang Jae ^a,c   Otani, Shigeki ^d   Oyama, S Ted ^e   Asakura, Kiyotaka ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b BANGLADESH OPEN UNIVERSITY   (Bangladesh)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e State University   (United States)

Author keywords

Atomic scale measurement; Hexagonal (1 1) structure; LEED; Reconstructed (2 3 2 3) structure and Ni2P single crystal; STM

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; PHOSPHORUS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SURFACE STRUCTURE;

ATOMIC SCALE MEASUREMENT; HEXAGONAL STRUCTURE; RECONSTRUCTED STRUCTURE;

NICKEL COMPOUNDS;

EID: 33845958725     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2404     Document Type: Conference Paper

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