SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 517, Issue 2, 2008, Pages 923-928

On the preparation of ultrathin tin dioxide by Langmuir-Blodgett films deposition

(3) Choudhury, Sipra a Betty, C A a Girija, K G a

a BHABHA ATOMIC RESEARCH CENTRE (India)

Author keywords

Electrical measurements; Langmuir Blodgett film; Octadecyl amine; Tin dioxide film; X ray photoelectron spectroscopy

Indexed keywords

AMINES; ATOMIC SPECTROSCOPY; CAPACITANCE; CATALYST ACTIVITY; ELECTRON SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; GOLD DEPOSITS; HEATING; LANGMUIR BLODGETT FILMS; METALLIC COMPOUNDS; MICROSCOPIC EXAMINATION; MULTILAYER FILMS; MULTILAYERS; ORGANIC COMPOUNDS; OXIDE FILMS; PHASE INTERFACES; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; SEMICONDUCTING FILMS; SODIUM; SPECTRUM ANALYSIS; SUBSTRATES; THICK FILMS; TIN; TIN DIOXIDE; TITANIUM COMPOUNDS; ULTRATHIN FILMS; ULTRAVIOLET SPECTROSCOPY; VOLTAGE MEASUREMENT; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

A STABLES; ATOMIC FORCES; CAPACITANCE-VOLTAGE; CRYSTALLINE STRUCTURES; ELECTRICAL MEASUREMENTS; FOURIER-TRANSFORM; GOLD STRUCTURES; LANGMUIR-BLODGETT; LANGMUIR-BLODGETT FILM; LB FILMS; LB TECHNIQUES; OCTADECYL; OCTADECYL AMINE; SOLID SUBSTRATES; STANNATE; THIN METAL OXIDES; THIN-FILMS; TIN DIOXIDE FILM; TIN DIOXIDE FILMS; UV-VISIBLE; WATER INTERFACES; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS MEASUREMENTS; XRD MEASUREMENTS;

FILM PREPARATION;

EID: 55049094794 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2008.08.183 Document Type: Article

Times cited : (18)

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