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Volumn 517, Issue 1, 2008, Pages 337-339

SiGe quantum well thermistor materials

Author keywords

Selective epitaxy growth; SiGe; Thermistor

Indexed keywords

CRYSTAL GROWTH; GERMANIUM; PUMPS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES; SILICON; SILICON ALLOYS; THERMISTORS;

EID: 54949157825     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.08.164     Document Type: Article
Times cited : (16)

References (7)
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    • Fulfilling the pedestrian protection directive using a long-wavelength infrared camera designed to meet both performance and cost targets
    • Källhammer J.-E. Fulfilling the pedestrian protection directive using a long-wavelength infrared camera designed to meet both performance and cost targets. Proc. SPIE 6198 (2006)
    • (2006) Proc. SPIE , vol.6198
    • Källhammer, J.-E.1
  • 3
    • 0015555198 scopus 로고
    • The quantitative effects of interface states on the performance of charge-coupled devices
    • Tompsett M.F. (Ed)
    • The quantitative effects of interface states on the performance of charge-coupled devices. In: Tompsett M.F. (Ed). IEEE Trum E/cc.rrrm I A-i Y. Vol. ED-20. no. 1 (1973) 45-55
    • (1973) IEEE Trum E/cc.rrrm I A-i Y. Vol. ED-20. no. 1 , pp. 45-55
  • 4
    • 0034317021 scopus 로고    scopus 로고
    • A non-fundamental theory of low-frequency noise in semiconductor devices
    • Mohammadi S., and Pavlidis D. A non-fundamental theory of low-frequency noise in semiconductor devices. IEEE trans on Electron Devices 47 11 (Nov. 2000) 2009-2017
    • (2000) IEEE trans on Electron Devices , vol.47 , Issue.11 , pp. 2009-2017
    • Mohammadi, S.1    Pavlidis, D.2
  • 6
    • 54949158845 scopus 로고    scopus 로고
    • M. Regis et al.; "Noise behaviour in SiGe devices"; Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse ; Silicon Monolithic Integrated Circuits in RF Systems, 2000. Digest of Papers. 2000.
    • M. Regis et al.; "Noise behaviour in SiGe devices"; Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse ; Silicon Monolithic Integrated Circuits in RF Systems, 2000. Digest of Papers. 2000.
  • 7
    • 33646092980 scopus 로고    scopus 로고
    • Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETs
    • Simoen E. Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETs. Solid-State Device Research Conference (2005)
    • (2005) Solid-State Device Research Conference
    • Simoen, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.