Sr induced striped surface reconstructions formed on Si(111)

Applied Physics Letters

Volumn 93, Issue 16, 2008, Pages

  Teys, S ^a   Olshanetsky, B ^a   Zhachuk, R ^b   Pereira, S ^b   Norga, G ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b UNIVERSITY OF AVEIRO   (Portugal)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; LINGUISTICS; MICROSCOPIC EXAMINATION; REPAIR; RESTORATION; SEPARATION; SILICON; SURFACE STRUCTURE;

ANTIPHASE DOMAINS; COHERENCE LENGTHS; COMPLEMENTARY; DIFFRACTION DATUM; LARGE SURFACE AREAS; REAL SPACES; SAMPLE TEMPERATURES; SI(111); STRIPED STRUCTURES; SUBMONOLAYER;

SCANNING TUNNELING MICROSCOPY;

EID: 54949121735     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3005594     Document Type: Article

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