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Acta Physica Polonica A

Volumn 114, Issue 5, 2008, Pages 1457-1464

Characterization of non-polar ZnO layers with positron annihilation spectroscopy

(4) Zubiaga, A a Tuomisto, F a Zuniga Perez J b Munoz San Jose V c

a AALTO UNIVERSITY (Finland)

b CNRS (France)

c UNIVERSITY OF VALENCIA (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRONS; GALLIUM NITRIDE; II-VI SEMICONDUCTORS; III-V SEMICONDUCTORS; ORGANOMETALLICS; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; SAPPHIRE; ZINC OXIDE;

ANNIHILATION RADIATIONS; GROWTH POLARITY; LAYER THICKNESS; METAL ORGANIC; NON-POLAR ZNO; VACANCY DEFECTS; ZN VACANCIES; ZNO LAYERS;

ZINC;

EID: 54949113753 PISSN: 05874246 EISSN: None Source Type: Journal
DOI: 10.12693/aphyspola.114.1257 Document Type: Conference Paper

Times cited : (11)

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