Near-field electromagnetic characterization and perturbation of logic circuits

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 11, 2008, Pages 2398-2404

  Dubois, Tristan ^a   Jarrix, Sylvie ^a   Penarier, Annick ^a   Nouvel, Philippe ^a   Gasquet, Daniel ^a   Chusseau, Laurnet ^a   Azais, Bruno ^b  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b CENTRE D ETUDES DE GRAMAT   (France)

Author keywords

Electromagnetic (EM) compatibility; EM interference (EMI); Imaging; Probe antennas; Sensitivity

Indexed keywords

ANTENNAS; CHARACTERIZATION; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVES; ELECTROMAGNETISM; MAGNETIC FIELDS; MAGNETIC MATERIALS; NETWORKS (CIRCUITS); SWITCHING CIRCUITS; SWITCHING THEORY;

ELECTROMAGNETIC (EM) COMPATIBILITY; EM INTERFERENCE (EMI); IMAGING; PROBE ANTENNAS; SENSITIVITY;

LOGIC CIRCUITS;

EID: 54949083826     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.926371     Document Type: Conference Paper

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