MMIC's characterization by very near-field technique

Microwave and Optical Technology Letters

Volumn 41, Issue 3, 2004, Pages 209-213

  Nativel, L ^a   Marchetti, M ^a   Falgayrettes, P ^a   Castagne M ^a   Gasquet, D ^a   Gall Borrut, P ^a   Castel, M ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

High resolution imaging; MMICs E.M.C.; Very near field measurements

Indexed keywords

ANTENNAS; CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETIC WAVE PROPAGATION; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; POWER AMPLIFIERS; WAVEGUIDES;

HIGH-RESOLUTION IMAGING; VECTOR NETWORK ANALYZERS (VNA); VERY NEAR-FIELD MEASUREMENTS;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 2342585507     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.20096     Document Type: Article

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