Micro-Raman spectroscopy as an in situ tool for probing radiation damage during microdiffraction experiments in soft condensed matter

Macromolecules

Volumn 41, Issue 19, 2008, Pages 7251-7253

  Davies, Richard J ^a   Burghammer, Manfred ^a   Riekel, Christian ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; DEGRADATION; DIFFRACTION; PUMPING PLANTS; RADIATION DAMAGE; SILICON;

A SPOTS; ACCELERATED DEGRADATIONS; AMORPHOUS FRACTION.; FOCAL POSITIONS; HETEROGENEOUS; IN SITU SYSTEMS; IN-SITU; MASS LOSSES; MICRODIFFRACTION; PRIMARY RADIATIONS; PROBING RADIATIONS; RAMAN BANDS; SECONDARY RADIATIONS; SOFT CONDENSED MATTERS;

PLASTIC PRODUCTS;

EID: 54849426009     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma801466j     Document Type: Article

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